Resonant side-jump thermal Hall effect of phonons coupled to dynamical defects
Virtualhttps://youtu.be/nnczlM1xhy4 Abstract: We present computations of the thermal Hall coefficient of phonons scattering off defects with multiple energy levels. Using a microscopic formulation based on the Kubo formula, we find that the leading contribution perturbative in the phonon-defect coupling is of the 'side-jump' type, which is proportional to the phonon lifetime. This contribution is at resonance […]